| target | platform_name | test suite | result | elapsed_time (sec) | copy_method | |-----------------------|---------------|----------------------------------------------------------------------------|--------|--------------------|-------------| | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-connectivity-mbedtls-tests-tests-mbedtls-multi | OK | 16.03 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-connectivity-netsocket-tests-tests-network-l3ip | OK | 14.33 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-buffered_serial | OK | 15.28 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-c_strings | OK | 20.18 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | OK | 15.65 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-dev_null | OK | 17.33 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-echo | OK | 16.1 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-flashiap | OK | 18.29 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-generic_tests | OK | 15.38 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | OK | 22.09 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | OK | 37.14 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | OK | 20.67 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-race_test | OK | 16.01 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | OK | 30.15 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-sleep_lock | OK | 14.55 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-stl_features | OK | 16.14 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | OK | 38.98 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | OK | 35.2 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | OK | 21.86 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | OK | 16.75 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-unbuffered_serial | OK | 14.83 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog | OK | 18.43 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog_reset | OK | 27.12 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | OK | 24.5 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-timing | OK | 75.92 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-basic_test | OK | 14.38 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-basic_test_default | OK | 15.23 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | OK | 16.28 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | OK | 22.16 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_repeat | OK | 16.45 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_selection | OK | 13.82 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_setup_failure | OK | 14.84 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_teardown_failure | OK | 14.93 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-control_type | OK | 15.1 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_async_scheduler | OK | 16.05 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | OK | 16.49 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-test_setup_failure | OK | 14.19 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-test_skip | OK | 14.86 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | OK | 24.11 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers_freq | OK | 35.28 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-critical_section | OK | 13.8 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-flash | OK | 16.54 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-lp_ticker | OK | 15.24 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-minimum_requirements | OK | 14.98 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-pinmap | OK | 14.54 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | OK | 56.65 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_reset | OK | 20.12 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | OK | 19.21 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time_conv | OK | 33.64 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep | OK | 19.03 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager | OK | 19.16 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager_racecondition | OK | 26.98 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-stack_size_unification | OK | 14.99 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | OK | 29.18 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-us_ticker | OK | 16.51 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | OK | 19.83 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_reset | OK | 28.92 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_timing | OK | 43.42 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-pin_names-generic | OK | 15.98 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | OK | 16.05 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | OK | 15.85 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | OK | 15.79 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | OK | 16.48 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-call_before_main | OK | 14.44 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-cpp | OK | 14.35 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-div | OK | 15.0 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-static_assert | OK | 13.58 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | OK | 35.87 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | OK | 20.96 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | OK | 16.78 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-error_handling | OK | 14.94 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | OK | 17.27 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | OK | 21.75 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-sharedptr | OK | 14.68 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-singletonptr | OK | 15.25 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-stream | OK | 15.56 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-system_reset | OK | 15.3 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-transaction | OK | 15.93 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-wait_ns | OK | 17.73 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-basic | OK | 32.13 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-condition_variable | OK | 20.22 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | OK | 23.45 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-heap_and_stack | OK | 19.78 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-kernel_tick_count | OK | 20.77 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | OK | 19.78 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-malloc | OK | 37.6 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | OK | 24.25 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | OK | 18.74 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | OK | 16.82 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | OK | 21.59 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | OK | 26.76 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | OK | 15.44 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | OK | 28.07 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-buffered_block_device | OK | 14.51 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-flashsim_block_device | OK | 14.65 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-general_block_device | OK | 14.03 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-heap_block_device | OK | 17.07 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-mbr_block_device | OK | 16.95 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-util_block_device | OK | 14.57 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tdbstore-tests-tests-tdbstore-whitebox | OK | 18.15 | default | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | OK | 29.01 | default | 101 OK | target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) | |-----------------------|---------------|----------------------------------------------------------------------------|------------------------------------------------------------------------------------------------------------------------|--------|--------|--------|--------------------| | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-connectivity-mbedtls-tests-tests-mbedtls-multi | Crypto: sha256_multi | 1 | 0 | OK | 0.84 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-connectivity-mbedtls-tests-tests-mbedtls-multi | Crypto: sha256_split | 1 | 0 | OK | 0.28 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-connectivity-netsocket-tests-tests-network-l3ip | L3IP_START | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-connectivity-netsocket-tests-tests-network-l3ip | L3IP_STOP | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-buffered_serial | Bytes are correctly received | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-buffered_serial | Bytes are correctly sent | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-c_strings | C strings: %i %d integer formatting | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-c_strings | C strings: %u %d integer formatting | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-c_strings | C strings: %x %E integer formatting | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-c_strings | C strings: strpbrk | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-c_strings | C strings: strtok | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | Test SD CRC polynomials | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | Test mode-limited CRC | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | Test not supported polynomials | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | Test partial CRC | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | Test supported polynomials | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-crc | Test thread safety | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-dev_null | mbed-os-drivers-tests-tests-mbed_drivers-dev_null | 1 | 0 | OK | 17.33 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-echo | Echo server: x16 | 1 | 0 | OK | 2.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-flashiap | FlashIAP - init | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-flashiap | FlashIAP - program | 1 | 0 | OK | 0.34 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-flashiap | FlashIAP - program across sectors | 1 | 0 | OK | 0.36 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-flashiap | FlashIAP - program errors | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-flashiap | FlashIAP - timing | 1 | 0 | OK | 0.38 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-generic_tests | Basic | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-generic_tests | Blinky | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-generic_tests | C++ heap | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-generic_tests | C++ stack | 1 | 0 | OK | 0.15 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test attach for 100ms and time measure | 1 | 0 | OK | 0.16 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test attach for 10ms and time measure | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test attach for 1ms and time measure | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test attach for 500ms and time measure | 1 | 0 | OK | 0.56 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test detach | 1 | 0 | OK | 0.74 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test multi call and time measure | 1 | 0 | OK | 1.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_ticker | Test multi ticker | 1 | 0 | OK | 0.28 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | 1 s delay accuracy (attach) | 1 | 0 | OK | 1.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | 1 s delay during deepsleep (attach) | 1 | 0 | OK | 1.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | 1 s delay during sleep (attach) | 1 | 0 | OK | 1.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | 10 ms delay accuracy | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | 5 s delay accuracy (attach) | 1 | 0 | OK | 5.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Callback called once | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Callback not called when cancelled | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Callback override | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Multiple timeouts running in parallel | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Reschedule in callback | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Timing drift (attach) | 1 | 0 | OK | 10.34 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timeout | Zero delay | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - float operator. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - measure time accumulation. | 1 | 0 | OK | 1.22 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - reset. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - start started timer. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - stopped after creation. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 1 ms. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 1 s. | 1 | 0 | OK | 1.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 10 ms. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 100 ms. | 1 | 0 | OK | 0.17 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-race_test | class init race | 1 | 0 | OK | 0.64 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-race_test | function init race | 1 | 0 | OK | 0.53 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Functional Test: RTC counts seconds. | 1 | 0 | OK | 10.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Functional Test: set time - CUSTOM_TIME_0. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Functional Test: set time - CUSTOM_TIME_1. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Functional Test: set time - CUSTOM_TIME_2. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: attach original RTC functions. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: attach stub RTC functions. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: set_time() - RTC functions are defined. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: set_time() - init RTC function is undefined. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: set_time() - write RTC function is undefined. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: time() - RTC functions are defined, RTC is disabled. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: time() - RTC functions are defined, RTC is enabled. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: time() - isenabled RTC function is undefined. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: time() - read RTC function is undefined. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-rtc | Unit Test: time() - result is stored in given buffer. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-sleep_lock | DeepSleepLock lock test | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-sleep_lock | timer lock test | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-stl_features | STL std::equal | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-stl_features | STL std::sort abs | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-stl_features | STL std::sort greater | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-stl_features | STL std::transform | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test attach for 100ms and time measure | 1 | 0 | OK | 0.16 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test attach for 10ms and time measure | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test attach for 500ms and time measure | 1 | 0 | OK | 0.56 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test detach | 1 | 0 | OK | 0.72 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test multi call and time measure | 1 | 0 | OK | 1.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test multi ticker | 1 | 0 | OK | 0.26 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test timers: 1x ticker | 1 | 0 | OK | 10.2 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-ticker | Test timers: 2x ticker | 1 | 0 | OK | 10.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | 1 s delay accuracy | 1 | 0 | OK | 1.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | 1 s delay during sleep | 1 | 0 | OK | 1.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | 10 ms delay accuracy | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | 5 s delay accuracy | 1 | 0 | OK | 5.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Callback called once | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Callback not called when cancelled | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Callback override | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Multiple timeouts running in parallel | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Reschedule in callback | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Timing drift | 1 | 0 | OK | 10.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timeout | Zero delay | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on os ticker) - measured time accumulation. | 1 | 0 | OK | 1.26 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on os ticker) - reset. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on os ticker) - start started timer. | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on os ticker) is stopped after creation. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on user ticker) - reset. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on user ticker) - start started timer. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on user ticker) is stopped after creation. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer (based on user ticker) measured time accumulation. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer - copying 5 ms. | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer - moving 5 ms. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer - time measurement 1 ms. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer - time measurement 1 s. | 1 | 0 | OK | 1.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer - time measurement 10 ms. | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timer | Test: Timer - time measurement 100 ms. | 1 | 0 | OK | 0.16 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test insert | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test insert timestamp from the past | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test insert_absolute | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test insert_absolute timestamp from the past | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test insert_absolute zero | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test remove after insert | 1 | 0 | OK | 0.19 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-timerevent | Test remove after insert_absolute | 1 | 0 | OK | 0.21 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-unbuffered_serial | Bytes are correctly received | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-unbuffered_serial | Bytes are correctly sent | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog | Restart multiple times | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog | Start, 100 ms | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog | Start, max_timeout | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog | Stop | 1 | 0 | OK | 0.23 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog | max_timeout is valid | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog_reset | Kicking the Watchdog prevents reset | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog_reset | Watchdog reset | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog_reset | Watchdog reset in deepsleep mode | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog_reset | Watchdog reset in sleep mode | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-drivers-tests-tests-mbed_drivers-watchdog_reset | Watchdog started again | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing allocate failure | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing call_every | 1 | 0 | OK | 2.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing call_in | 1 | 0 | OK | 2.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing calls with 0 args | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing calls with 1 args | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing calls with 2 args | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing calls with 3 args | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing calls with 4 args | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing calls with 5 args | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing event cancel 1 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing event period values | 1 | 0 | OK | 0.78 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing mixed dynamic & static events queue | 1 | 0 | OK | 0.15 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing static events queue | 1 | 0 | OK | 0.45 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing the event class | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing the event class helpers | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing the event inference | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-queue | Testing time_left | 1 | 0 | OK | 0.35 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-timing | Testing accuracy of equeue semaphore | 1 | 0 | OK | 20.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-timing | Testing accuracy of equeue tick | 1 | 0 | OK | 20.02 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-events-tests-tests-events-timing | Testing accuracy of timer | 1 | 0 | OK | 20.02 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-basic_test | Repeating Test | 2 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-basic_test | Simple Test | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-basic_test_default | Repeating Test | 2 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-basic_test_default | Simple Test | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | Validate: Attributed Validation: Cancel Repeat | 1 | 0 | OK | 0.17 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | Validate: Attributed Validation: Enable Repeat Handler | 2 | 0 | OK | 0.17 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | Validate: Multiple Premature Validation | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | Validate: Multiple Validation | 1 | 0 | OK | 0.16 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | Validate: Premature Validation | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_async_validate | Validate: Simple Validation | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: Await | 1 | 0 | OK | 1.41 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: CaseNext | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: NoTimeout | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: RepeatAllOnTimeout | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: RepeatHandlerOnTimeout | 1 | 0 | OK | 1.54 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: Timeout (Failure) | 1 | 0 | OK | 0.21 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_async | Control: Timeout (Success) | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_repeat | Control: CaseNext | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_repeat | Control: NoRepeat | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_repeat | Control: RepeatAll | 10 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_control_repeat | Control: RepeatHandler | 10 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_selection | Case 1 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_selection | Case 2 | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_selection | Case 3 | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_setup_failure | Setup handler returns ABORT | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_setup_failure | Setup handler returns CONTINUE | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_setup_failure | Setup handler returns IGNORE | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_teardown_failure | Teardown handler returns ABORT | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_teardown_failure | Teardown handler returns ABORT but is IGNORED | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-case_teardown_failure | Teardown handler returns CONTINUE | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-control_type | Testing combinations of different group | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-control_type | Testing combinations of same group | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-control_type | Testing constants | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-control_type | Testing constructors | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_async_scheduler | Minimal Scheduler: Async Case 4 (Failure) | 0 | 0 | OK | 0.34 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_async_scheduler | Minimal Scheduler: Case 1 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_async_scheduler | Minimal Scheduler: Case 2 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_async_scheduler | Minimal Scheduler: Case 3 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 1 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 2 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 3 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 4 | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 5 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 6 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 7 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-minimal_scheduler | Minimal Scheduler: Case 8 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-test_setup_failure | dummy test | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-test_setup_failure | dummy test 2 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-test_skip | Conditional test skip macro test | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-features-frameworks-utest-tests-unit_tests-test_skip | Unconditional test skip macro test | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker fire interrupt | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker increment test | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker info test | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker init is safe to call repeatedly | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker interrupt test | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker overflow test | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker past interrupt test | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker reschedule test | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | Microsecond ticker speed test | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker fire interrupt | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker increment test | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker info test | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker init is safe to call repeatedly | 1 | 0 | OK | 0.31 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker interrupt test | 1 | 0 | OK | 3.87 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker overflow test | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker past interrupt test | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker reschedule test | 1 | 0 | OK | 0.42 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers | lp ticker speed test | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers_freq | Low power ticker frequency test | 1 | 0 | OK | 10.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-common_tickers_freq | Microsecond ticker frequency test | 1 | 0 | OK | 10.27 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-critical_section | Test critical section nested lock | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-critical_section | Test critical section single lock | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-flash | Flash - clock and cache test | 1 | 0 | OK | 0.34 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-flash | Flash - erase sector | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-flash | Flash - init | 1 | 0 | OK | 0.33 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-flash | Flash - mapping alignment | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-flash | Flash - program page | 1 | 0 | OK | 0.33 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-lp_ticker | lp ticker glitch test | 1 | 0 | OK | 0.28 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-lp_ticker | lp ticker info test | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-lp_ticker | lp ticker sleep test | 1 | 0 | OK | 0.19 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-minimum_requirements | Minimum data test | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-minimum_requirements | Minimum heap test | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-pinmap | pinmap - validation | 1 | 0 | OK | 0.42 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - accuracy | 1 | 0 | OK | 9.54 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - enabled | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - glitch | 1 | 0 | OK | 3.52 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - init | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - persist | 1 | 0 | OK | 4.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - range | 1 | 0 | OK | 16.01 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - sleep | 1 | 0 | OK | 8.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc | RTC - write/read | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_reset | mbed-os-hal-tests-tests-mbed_hal-rtc_reset | 1 | 0 | OK | 20.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test is leap year - RTC leap years full support | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test is leap year - RTC leap years partial support | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test local time - invalid param | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test make time - invalid param | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test make time boundary values - RTC leap years full support | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test make time boundary values - RTC leap years partial support | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time | test set_time twice | 1 | 0 | OK | 2.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time_conv | test make time and local time - RTC leap years full support | 1 | 0 | OK | 9.51 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-rtc_time_conv | test make time and local time - RTC leap years partial support | 1 | 0 | OK | 9.42 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep | deep-sleep - high-speed clocks are turned off | 1 | 0 | OK | 0.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep | deep-sleep - source of wake-up - lp ticker | 1 | 0 | OK | 2.3 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep | sleep - source of wake-up - us ticker | 1 | 0 | OK | 1.4 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager | deep sleep lock/unlock | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager | deep sleep lock/unlock test_check | 1 | 0 | OK | 3.23 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager | deep sleep locked USHRT_MAX times | 1 | 0 | OK | 0.39 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager | sleep_auto calls sleep/deep sleep based on lock | 1 | 0 | OK | 0.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager_racecondition | deep sleep lock/unlock is IRQ safe | 1 | 0 | OK | 10.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-sleep_manager_racecondition | deep sleep lock/unlock is thread safe | 1 | 0 | OK | 2.57 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-stack_size_unification | Stack size unification test | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | legacy insert event head | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | legacy insert event in overflow range | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | legacy insert event multiple overflow | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | legacy insert event outside overflow range | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | legacy insert event overflow | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | legacy insert event tail | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_frequencies_and_masks | 1 | 0 | OK | 2.76 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_insert_event_us_head | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_insert_event_us_in_overflow_range | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_insert_event_us_multiple_random | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_insert_event_us_outside_overflow_range | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_insert_event_us_tail | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_insert_event_us_underflow | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_insert_immediate_in_irq | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_insert_non_immediate_in_irq | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_multiple_event_multiple_dequeue | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_multiple_event_single_dequeue | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_multiple_event_single_dequeue_overflow | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_single_event | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_irq_handler_single_event_spurious | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_legacy_insert_event_multiple_random | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_match_interval_passed | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_match_interval_passed_table | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_remove_event_head | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_remove_event_invalid | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_remove_event_tail | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_remove_random | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_set_interrupt_past_time | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_set_interrupt_past_time_with_delay | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_suspend_resume | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | test_ticker_max_value | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | ticker initialization | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | ticker multiple initialization | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | ticker read | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | ticker read overflow | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | update overflow guard | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-ticker | update overflow guard in case of spurious interrupt | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-us_ticker | us ticker info test | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | Init, 100 ms | 1 | 0 | OK | 0.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | Init, max_timeout | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | Platform feature max_timeout is valid | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | Stopped watchdog can be started again | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | Update config with multiple init calls | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog | Watchdog can be stopped | 1 | 0 | OK | 0.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_reset | Kicking the Watchdog prevents reset | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_reset | Watchdog reset | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_reset | Watchdog reset in deepsleep mode | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_reset | Watchdog reset in sleep mode | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_reset | Watchdog started again | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_timing | Timing, 1000 ms | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_timing | Timing, 200 ms | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_timing | Timing, 3000 ms | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_timing | Timing, 500 ms | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-mbed_hal-watchdog_timing | timeout accuracy | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-pin_names-generic | BUTTON1 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-pin_names-generic | LED1 | 1 | 0 | OK | 1.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-hal-tests-tests-pin_names-generic | LED2 | 1 | 0 | OK | 1.03 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing callbacks with 0 ints | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing callbacks with 1 ints | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing callbacks with 2 ints | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing callbacks with 3 ints | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing callbacks with 4 ints | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing callbacks with 5 ints | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback | Testing trivial function object | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | Testing callbacks with 0 uint64s | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | Testing callbacks with 1 uint64s | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | Testing callbacks with 2 uint64s | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | Testing callbacks with 3 uint64s | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | Testing callbacks with 4 uint64s | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_big | Testing callbacks with 5 uint64s | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | Testing callbacks with 0 uchars | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | Testing callbacks with 1 uchars | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | Testing callbacks with 2 uchars | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | Testing callbacks with 3 uchars | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | Testing callbacks with 4 uchars | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_functional-callback_small | Testing callbacks with 5 uchars | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing ALIGN attribute | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing DEPRECATED attribute | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing FALLTHROUGH attribute | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing FORCEINLINE attribute | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing NORETURN attribute | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing PACKED attribute | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing PURE attribute | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing UNREACHABLE attribute | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing UNUSED attribute | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-attributes | Testing WEAK attribute | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-call_before_main | Test mbed_main called before main | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-cpp | Test heap object | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-cpp | Test stack object | 1 | 0 | OK | 0.16 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-div | Test division | 1 | 0 | OK | 0.18 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_micro-static_assert | Compilation test | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add 16-bit | 1 | 0 | OK | 0.28 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add 32-bit | 1 | 0 | OK | 0.5 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add 64-bit | 1 | 0 | OK | 0.34 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add 8-bit | 1 | 0 | OK | 0.4 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add release 32-bit | 1 | 0 | OK | 0.37 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add signed 16-bit | 1 | 0 | OK | 0.28 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add signed 32-bit | 1 | 0 | OK | 0.38 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add signed 64-bit | 1 | 0 | OK | 0.34 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic add signed 8-bit | 1 | 0 | OK | 0.59 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic bitops 16-bit | 1 | 0 | OK | 0.78 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic bitops 32-bit | 1 | 0 | OK | 0.71 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic bitops 64-bit | 1 | 0 | OK | 0.73 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic bitops 8-bit | 1 | 0 | OK | 0.78 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange strong 16-bit | 1 | 0 | OK | 0.78 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange strong 32-bit | 1 | 0 | OK | 0.69 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange strong 64-bit | 1 | 0 | OK | 0.55 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange strong 8-bit | 1 | 0 | OK | 0.76 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange weak 16-bit | 1 | 0 | OK | 0.62 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange weak 32-bit | 1 | 0 | OK | 0.59 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange weak 64-bit | 1 | 0 | OK | 0.55 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic compare exchange weak 8-bit | 1 | 0 | OK | 0.78 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic sub 16-bit | 1 | 0 | OK | 0.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic sub 32-bit | 1 | 0 | OK | 0.25 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic sub 64-bit | 1 | 0 | OK | 0.3 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test atomic sub 8-bit | 1 | 0 | OK | 0.23 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test large atomic custom structure | 1 | 0 | OK | 0.62 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-atomic | Test small atomic custom structure | 1 | 0 | OK | 0.85 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input does not exceed capacity(1) push max, pop max. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input does not exceed capacity(10) push 2, pop 1. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input does not exceed capacity(3) push max, pop max. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input does not exceed capacity(5) push 2, pop 1. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input exceeds capacity(1) push max+1, pop max. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input exceeds capacity(10) push 2, pop 1. | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input exceeds capacity(3) push max+1, pop max. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input exceeds capacity(5) push 2, pop 1 - complex type. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Input exceeds capacity(5) push 2, pop 1. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Test CounterType/BufferSize boarder case. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | Test pop(), peek(), empty(), full(), size() after CircularBuffer creation. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | empty() returns true when buffer(3 elements) is empty. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | empty() returns true when buffer(5 elements) is empty. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | full() returns true when buffer(3 elements) is full. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | full() returns true when buffer(5 elements) is full. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | peek() return data without popping the element. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-circularbuffer | reset() clears the buffer. | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | Test critical section C API | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | Test critical section C API nested lock | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | Test critical section C++ API constructor/destructor | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | Test critical section C++ API constructor/destructor nested lock | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | Test critical section C++ API enable/disable | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-critical_section | Test critical section C++ API enable/disable nested lock | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-error_handling | Test error context capture | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-error_handling | Test error counting and reset | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-error_handling | Test error encoding, value capture, first and last errors | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test fopen/fclose | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test fprintf/fscanf | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test fputc/fgetc | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test fputs/fgets | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test fseek/ftell | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test ftruncate/fstat | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-filehandle | Test fwrite/fread | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | printf %% | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | printf %d | 1 | 0 | OK | 0.6 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | printf %u | 1 | 0 | OK | 0.46 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | printf %x | 1 | 0 | OK | 0.48 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf %% | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf %d | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf %u | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf %x | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %d | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %ld | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %lld | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %llu | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %llx | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %lu | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %lx | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %u | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf buffer overflow %x | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-minimal-printf | snprintf unsupported specifier | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-sharedptr | Test equality comparators | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-sharedptr | Test instance sharing across multiple shared pointers | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-sharedptr | Test single shared pointer instance | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-singletonptr | Test lazy initialization | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-singletonptr | Test single instance | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-stream | Test printf/scanf | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-stream | Test putc/getc | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-stream | Test puts/gets | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-stream | Test vprintf/vscanf | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-system_reset | mbed-os-platform-tests-tests-mbed_platform-system_reset | 1 | 0 | OK | 15.3 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-transaction | Test Transaction - init | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-transaction | Test Transaction - init | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-transaction | Test Transaction - no init | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-transaction | Test Transaction - no init | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-wait_ns | Test: wait_ns - compare with lp_timer 1s | 1 | 0 | OK | 1.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-platform-tests-tests-mbed_platform-wait_ns | Test: wait_ns - compare with us_timer 1s | 1 | 0 | OK | 1.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-basic | Test ThisThread::sleep_for accuracy | 1 | 0 | OK | 10.21 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-condition_variable | Test linked list | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-condition_variable | Test notify all | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-condition_variable | Test notify one | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test clear/set with prohibited flag | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test empty clear | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test empty get | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test empty set | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-eventflags wait_all | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-eventflags wait_any | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-eventflags wait_any no clear | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-threaded wait_all | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-threaded wait_all many wait | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-threaded wait_any | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-threaded wait_any no clear | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test multi-threaded wait_any timeout | 1 | 0 | OK | 0.36 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-event_flags | Test set/get/clear for full flag range | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-heap_and_stack | Test global variables initialisation | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-heap_and_stack | Test heap allocation and free | 1 | 0 | OK | 0.18 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-heap_and_stack | Test heap in range | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-heap_and_stack | Test isr stack in range | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-heap_and_stack | Test main stack in range | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-kernel_tick_count | Test if kernel ticker increments by one | 1 | 0 | OK | 1.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-kernel_tick_count | Test kernel ticker accuracy | 1 | 0 | OK | 1.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-kernel_tick_count | Test kernel ticker declared frequency | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test get with timeout on empty mailbox | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test get without timeout on empty mailbox | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test invalid message free | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test mail empty | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test mail full | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test mailbox max size | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message send order | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message send/receive multi-thread and per thread order | 1 | 0 | OK | 0.39 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message send/receive multi-thread, multi-Mail and per thread order | 1 | 0 | OK | 0.18 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message send/receive single thread and order | 1 | 0 | OK | 0.15 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message type uint16 | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message type uint32 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test message type uint8 | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test null message free | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mail | Test try_calloc | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-malloc | Test 0 size allocation | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-malloc | Test NULL pointer free | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-malloc | Test large allocation | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-malloc | Test multiple alloc and free calls | 1 | 0 | OK | 0.96 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-malloc | Test multithreaded allocations | 1 | 0 | OK | 20.02 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: fail (out of free blocks). | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: free() - robust (free called with invalid param - NULL). | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: free() - robust (free called with invalid param). | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: free() - success, 4 bytes b_type, q_size equal to 1. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: free() - success, 4 bytes b_type, q_size equal to 3. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: free() - success, complex b_type, q_size equal to 1. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: free() - success, complex b_type, q_size equal to 3. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: re-allocation of the first block, basic type. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: re-allocation of the first block, complex type. | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: re-allocation of the last block, basic type. | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: re-allocation of the last block, complex type. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: timeout | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: try_alloc()/try_calloc() - success, 1 bytes b_type, q_size equal to 1. | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: try_alloc()/try_calloc() - success, 1 bytes b_type, q_size equal to 3. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: try_alloc()/try_calloc() - success, 4 bytes b_type, q_size equal to 1. | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: try_alloc()/try_calloc() - success, 4 bytes b_type, q_size equal to 3. | 1 | 0 | OK | 0.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: try_alloc()/try_calloc() - success, complex b_type, q_size equal to 1. | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: try_alloc()/try_calloc() - success, complex b_type, q_size equal to 3. | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-memorypool | Test: wait forever | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test dual thread lock locked | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test dual thread lock unlock | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test dual thread second thread lock | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test dual thread second thread trylock | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test dual thread trylock locked | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test multiple thread | 1 | 0 | OK | 2.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test single thread lock | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test single thread lock recursive | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-mutex | Test single thread trylock | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test get empty wait forever | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test get from empty queue no timeout | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test get from empty queue timeout | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test message ordering | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test message priority | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test pass msg | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test pass msg twice | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test put full no timeout | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test put full timeout | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test put full wait forever | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test queue empty | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-queue | Test queue full | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test 0 tokens no timeout | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test 1 token no timeout | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test multiple threads | 1 | 0 | OK | 3.27 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test multiple tokens release | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test multiple tokens wait | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test semaphore acquire | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test semaphore try acquire | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test semaphore try acquire timeout | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test semaphore try timeout | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test single thread | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-semaphore | Test timeout | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate all flags clear in one shot | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate all flags clear in one shot using ticker callback | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate all flags set in one shot | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate all flags set one by one in loop | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate flags_wait return status if timeout specified: 0[ms] all flags | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate flags_wait return status if timeout specified: 0[ms] no flags | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate flags_wait return status if timeout specified: 1[ms] all flags | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate flags_wait return status if timeout specified: 1[ms] no flags | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if any flags are set on just created thread | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if any flags are set on ticker callback | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if flags_wait_all_for accumulate flags and return correctly when all flags set | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if flags_wait_all_for return correctly when all flags set | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if main thread flags_wait_all_for accumulate flags and return correctly when all flags set by ticker callback | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if setting same flag twice cause any unwanted behaviour | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate if setting same flag twice cause any unwanted behaviour when ticker callbacks set | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate that call flags_clear(NO_SIGNALS) doesn't change thread flags and return actual flags | 1 | 0 | OK | 0.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate that call flags_set with prohibited flag doesn't change thread flags | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate that call of flags_wait_all_for return correctly when thread has all flags already set | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate that main thread call of flags_wait_all_for return correctly when ticker callback set all flags | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate that ticker callback flags_clear(NO_SIGNALS) doesn't change main thread flags and return actual flags | 1 | 0 | OK | 0.14 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate ticker callback flags_wait return status if timeout specified: 0[ms] all flags | 1 | 0 | OK | 0.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate ticker callback flags_wait return status if timeout specified: 0[ms] no flags | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate ticker callback flags_wait return status if timeout specified: 1[ms] all flags | 1 | 0 | OK | 0.13 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-signals | Validate ticker callback flags_wait return status if timeout specified: 1[ms] no flags | 1 | 0 | OK | 0.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Handler called twice | 1 | 0 | OK | 0.12 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Tick can be cancelled | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Tick count is updated correctly | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Tick count is zero upon creation | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Time is updated correctly | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Wake up from deep sleep | 1 | 0 | OK | 0.09 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-systimer | Wake up from sleep | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing parallel threads | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing parallel threads with child | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing parallel threads with murder | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing parallel threads with wait | 1 | 0 | OK | 0.15 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing parallel threads with yield | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing serial threads | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing serial threads with child | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing serial threads with murder | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing serial threads with wait | 1 | 0 | OK | 1.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing serial threads with yield | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing single thread | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing single thread with child | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing single thread with murder | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing single thread with wait | 1 | 0 | OK | 0.16 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing single thread with yield | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread flags: flags clear | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread flags: multi-bit all | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread flags: multi-bit all timeout | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread flags: multi-bit any | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread flags: timeout | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread flags: wait | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread name | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread priority ops | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread self terminate | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread stack info | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: deleted | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait delay | 1 | 0 | OK | 0.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait event flag | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait message get | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait message put | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait mutex | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait semaphore | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread states: wait thread flags | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread wait | 1 | 0 | OK | 0.19 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-rtos-tests-tests-mbed_rtos-threads | Testing thread with external stack memory | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-buffered_block_device | BufferedBlockDevice functionality test | 1 | 0 | OK | 0.31 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-flashsim_block_device | FlashSimBlockDevice functionality test | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-heap_block_device | Testing get type functionality | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-heap_block_device | Testing read write random blocks | 1 | 0 | OK | 2.11 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-mbr_block_device | Testing formatting of master boot record | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-mbr_block_device | Testing mbr attributes | 1 | 0 | OK | 0.63 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-mbr_block_device | Testing mbr read write | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-util_block_device | Testing chaining of block devices | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-util_block_device | Testing profiling of block devices | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-blockdevice-tests-tests-blockdevice-util_block_device | Testing slicing of a block device | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tdbstore-tests-tests-tdbstore-whitebox | TDBStore: Multiple set test | 1 | 0 | OK | 2.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tdbstore-tests-tests-tdbstore-whitebox | TDBStore: White box test | 1 | 0 | OK | 1.78 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_buffer_null_size_not_zero | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_buffer_size_bigger_than_data_real_size | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_buffer_size_is_zero | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_buffer_size_smaller_than_data_real_size | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_existed_key | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_info_null | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_key_length_exceeds_max | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_key_null | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_non_existing_key | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_overwritten_key | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_info_removed_key | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_key_length_exceeds_max | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_key_null | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_key_that_was_set_twice | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_non_existing_key | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_removed_key | 1 | 0 | OK | 0.04 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | get_several_keys_multithreaded | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_close_right_after_iterator_open | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_empty_list | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_empty_list_keys_removed | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_empty_list_non_matching_prefix | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_full_list | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_key_size_zero | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_one_key_list | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_path_check | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_remove_while_iterating | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_next_several_overwritten_keys | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | iterator_open_it_null | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | kvstore_init | 1 | 0 | OK | 0.1 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | remove_existed_key | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | remove_key_length_exceeds_max | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | remove_key_null | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | remove_non_existing_key | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | remove_removed_key | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_buffer_null_size_not_zero | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_buffer_size_is_zero | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_length_exceeds_max | 1 | 0 | OK | 0.07 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_null | 1 | 0 | OK | 0.05 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_value_fifteen_byte_size | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_value_five_byte_size | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_value_one_byte_size | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_value_seventeen_byte_size | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_key_value_two_byte_size | 1 | 0 | OK | 0.06 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_same_key_several_time | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_several_key_value_sizes | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_several_keys_multithreaded | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_several_unvalid_key_names | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_write_once_flag_try_remove | 1 | 0 | OK | 0.08 | | MAX32670EVKIT-GCC_ARM | MAX32670EVKIT | mbed-os-storage-kvstore-tests-tests-kvstore-static_tests | set_write_once_flag_try_set_twice | 1 | 0 | OK | 0.08 | 669 OK