Add more smart attributes written from NVME drives

[coccobill1]

Feature Request

More smart attributes should be logged when using the inputs.smart plugin with NVME devices.
Currently the plugin pulls smart_device data from NVME drives, along with the following smart_attributes: Temperature and Power Cycle Count. Temperature is already included in the smart_device data, so the benefit of adding attributes: true is limited. It would be helpful if additional smart attribute fields were logged.

Proposal:

Add at the minimum the following smart attributes (from Samsung 970 EVO):

• Power On Hours
• Media and Data Integrity Errors
• Error Information Log Entries
• Critical Warning
• Available Spare

Other key attributes possibly logged by other NVME devices:

• Reallocated Sector Count
• Wear Leveling Count
• Uncorrectable Errors Count

Use case:

The data can be used to detect or predict a drive failure.