After slice, take stack at different intensity at specific xyz

[davidackerman]

There will be a separate reference on the stage at a specific xyz position that will be imaged and used for calibration. So the process will be: after slice and before explore or surface find, move to specific xyz and take a stack at a separate laser intensity. This will be a setting in the .microscope file that will allow the user to choose v_open (percentage) for this specific task. This will be used to change one of the pockels.

[davidackerman]

Add ability to toggle it on and off. Also add ability to have array of targets.

[davidackerman]

Put the images in a separate folder in the same folder containing all the dates. Also make sure that movement to and from the calibration stack is done in a safe way, ie, move the stage down first, then move to image and vice versa.

[davidackerman]

By default, should be off

[davidackerman]

Make sure this has the inc(false) so that don't run into same date issue as occurs during autotile.