esp32 s2 tiny usb driver lost complete interrupt during concurrent IN & OUT test (IDFGH-6285) #7952
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Resolution: Duplicate
This issue or pull request already exists
Status: Done
Issue is done internally
Environment
verion:esp-idf-4.3-beta3
EPS32 S2 as a usb device
host : centos7
Describe your problem
esp-idf-4.3-beta3\esp-idf-4.3-beta3\components\tinyusb\tinyusb\src\portable\espressif\esp32s2\dcd_esp32s2.c
when concurrent issue USB IN & OUT transcation in stress test. it seem lost complete interrupt that cause USB can't work.
(USB0.out_ep_reg[n].doepint & USB_XFERCOMPL0_M) or(USB0.in_ep_reg[n].diepint & USB_D_XFERCOMPL0_M) can't ocurr in bad case.
I suspect the esp-idf tiny usb have known limitation beacuse the IOT project use a Semphore for switch IN or OUT transfer.
refer:
esp-iot-solution\components\usb\tinyusb\additions\tusb\src\class\net\net_device.c
3. my queston:
is that it's a limitation for usb transfer? or it's a bug ?
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