Closed
Description
Description of defect
Cypress: FPGA: gpio test looks like not valid.
In file TESTS/mbed_hal_fpga_ci_test_shield/gpio/main.cpp line 165:
`
// Initialize GPIO pin as an input, pull-up mode.
memset(&gpio, 0, sizeof gpio);
gpio_init_inout(&gpio, pin, PIN_INPUT, PullUp, 0);
TEST_ASSERT_NOT_EQUAL(0, gpio_is_connected(&gpio));
tester.gpio_write(MbedTester::LogicalPinGPIO0, 0, false);
wait_us(HI_Z_READ_DELAY_US);
TEST_ASSERT_EQUAL_INT(1, gpio_read(&gpio)); // hi-Z, pulled up
gpio_free(&gpio);`
PSoC6 set 0, tester(FPGA) set 0. But expect 1. Test FAILED. It looks like it doesn't make sense.
This test PASSED if set PSOC6 1, tester(FPGA) set 0.
Target(s) affected by this defect ?
Tested on CY8CKIT_062_WIFI_BT
Toolchain(s) (name and version) displaying this defect ?
Tested on GCC_ARM
What version of Mbed-os are you using (tag or sha) ?
Latest
What version(s) of tools are you using. List all that apply (E.g. mbed-cli)
N/A
How is this defect reproduced ?
Always