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EFM32: pinmap test fails #12371
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Internal Jira reference: https://jira.arm.com/browse/MBOTRIAGE-2535 |
This was referenced Feb 5, 2020
Closed
The solution is to change
to
in |
Thanks @amq ! |
Was the mentioned PR ever created? :) |
I don't think I've seen one. |
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Description of defect
tests-mbed_hal-pinmap
always fails on EFM32. The LED shows the mbed crash pattern after I run it. Other tests apart of #12373 are fine.It errors out at
gpio_pinmap
with:If I comment out
gpio_pinmap
, then the test fails atgpio_irq_pinmap
, also with a crash.Related to #9449 and #10644
Target(s) affected by this defect ?
Verified on
EFM32GG_STK3700
,EFM32PG12_STK3402
andEFM32GG11_STK3701
, most probably affects all EFM32 targets.Toolchain(s) (name and version) displaying this defect ?
GNU Tools Arm Embedded 9 2019-q4-major
What version of Mbed-os are you using (tag or sha) ?
master
atf73a62afbf4052b4da8c5b862ffb4708a80c1b6e
Also verified with:
mbed-os-5.13.4
at1bf6b20df9d3cd5f29f001ffc6f0d0fcbbb96118
What version(s) of tools are you using. List all that apply (E.g. mbed-cli)
mbed-cli 1.10.2
How is this defect reproduced ?
The text was updated successfully, but these errors were encountered: