K64F, K82F: failing storage tests when SD component is not available

[mprse]

Description

Issue found on master:
51b8d6e (HEAD -> master, upstream/master) Merge pull request #9187 from deepikabhavnani/iar8_build_failures

If the SD component is removed from components list of K64F and K82F targets in targets.json configuration file, then the following tests fail:

Test	Board	Compiler	Result
features-storage-tests-blockdevice-general_block_device	K82F, K64F	ARM, GCC_ARM, IAR	failed
features-device_key-tests-device_key-functionality	K82F, K64F	ARM, GCC_ARM, IAR	failed
features-storage-tests-kvstore-static_tests	K82F, K64F	ARM, GCC_ARM, IAR	failed
features-storage-tests-kvstore-general_tests_phase_1	K82F, K64F	ARM, GCC_ARM, IAR	failed
features-storage-tests-kvstore-securestore_whitebox	K82F, K64F	ARM, GCC_ARM, IAR	failed
tests-psa-prot_internal_storage	K64F	ARM, GCC_ARM, IAR	failed

These tests store the data on the storage device. If SD component is available, then SD card is used as a storage device. If SD component is not available then Flash is used instead since FLASHIAP component is available also for both boards.

Issue request type

[ ] Question
[ ] Enhancement
[X] Bug

[0xc0170]

cc @ARMmbed/team-nxp

[ciarmcom]

Internal Jira reference: https://jira.arm.com/browse/MBOCUSTRIA-380

[mmahadevan108]

While investigating I came across a potential issue with the test. The below line is trying to program without doing an erase. This could potentially fail on flash locations that are not in the erase state.
https://github.com/ARMmbed/mbed-os/blob/master/features/storage/TESTS/blockdevice/general_block_device/main.cpp#L366

Kindly review the other test failures to see if this could be the cause for failures seen with Flash operation

[0xc0170]

Kindly review the other test failures to see if this could be the cause for failures seen with Flash operation

@ARMmbed/mbed-os-storage Please review

[offirko]

As @mmahadevan108 analyzed, the "general_block_device" test is failing due to test bug of programing prior to erasing. It will be fixed - Thanks !

The rest of the tests are no longer failing on updated master. They failed because the storage type did not match the selected component (FlashIAP). A recent change in mbed-os made the storage type selected according to the component defined in targets.json so it no longer fails.

[offirko]

Fix will be delivered within PR #9377

[ciarmcom]

Thank you for raising this detailed GitHub issue. I am now notifying our internal issue triagers.
Internal Jira reference: https://jira.arm.com/browse/IOTOSM-2123