v0.3.0

Change since last version

• Add TDISP test cases.
• Add CXL TSP test cases.
• Support non-zero port_index values in PCIE IDE.

v0.2.1

Change since last version

• Add CXL IDE_KM test.
• Fix the order of key byte in IDE_KM test. See https://github.com/intel/tee-io-validator/blob/main/doc/key_byte_order.md

TEE-IO Validator v0.2.0

Changes from v0.1.0

• Upgrade libspdm to tag v3.3.0
• Support key_refresh
• Support below 2 test configs: PCRC and Selective IDE for Configuration Request
• Run test configuration with combination
• Use DOE discovery to find out the correct DOE offset in ecap
• Support multiple rootports and endpoints in ide_test.ini
• Dump logs to a text file
• Fix other errors