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ZTS: import_rewind_device_replaced reliably fails
The import_rewind_device_replaced.ksh test was never entirely reliable because it depends on MOS data not being overwritten. The MOS data is not protected by the snapshot so occasional failures were always expected. However, this test is now failing reliably on all platforms indicating something has changed in the code since the test was marked "maybe". Convert the test to a "known" failure until the root cause is identified and resolved. Reviewed-by: John Kennedy <john.kennedy@delphix.com> Reviewed-by: George Melikov <mail@gmelikov.ru> Signed-off-by: Brian Behlendorf <behlendorf1@llnl.gov> Closes #12821
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