Make test suite setup and teardown functions static (#33330)

* Make test suite setup and teardown functions static

* Restyled by clang-format

* Fixed bug in LoopbackTransport initialization

---------

Co-authored-by: Restyled.io <commits@restyled.io>

src/app/tests/AppTestContext.h

@@ -28,13 +28,13 @@ class AppContext : public LoopbackMessagingContext
 {
 public:
  // Performs shared setup for all tests in the test suite
- void SetUpTestSuite() override;
+ static void SetUpTestSuite();
  // Performs shared teardown for all tests in the test suite
- void TearDownTestSuite() override;
+ static void TearDownTestSuite();
  // Performs setup for each individual test in the test suite
- void SetUp() override;
+ void SetUp();
  // Performs teardown for each individual test in the test suite
- void TearDown() override;
+ void TearDown();
 };
 
 } // namespace Test

src/app/tests/TestAclAttribute.cpp

@@ -259,10 +259,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
  "TestAclAttribute",
  &sTests[0],
- TestAccessContext::nlTestSetUpTestSuite,
- TestAccessContext::nlTestTearDownTestSuite,
- TestAccessContext::nlTestSetUp,
- TestAccessContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestAccessContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestAccessContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestAccessContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestAccessContext, TearDown),
 };
 
 } // namespace

src/app/tests/TestAclEvent.cpp

@@ -377,10 +377,10 @@ nlTestSuite sSuite =
 {
  "TestAclEvent",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestBufferedReadCallback.cpp

@@ -610,10 +610,10 @@ nlTestSuite theSuite =
 {
  "TestBufferedReadCallback",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 }

src/app/tests/TestClusterStateCache.cpp

@@ -695,10 +695,10 @@ nlTestSuite theSuite =
 {
  "TestClusterStateCache",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 }

src/app/tests/TestCommandInteraction.cpp

@@ -2120,10 +2120,10 @@ nlTestSuite sSuite =
 {
  "TestCommandInteraction",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestEventLogging.cpp

@@ -318,10 +318,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
  "EventLogging",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

src/app/tests/TestEventLoggingNoUTCTime.cpp

@@ -84,16 +84,16 @@ class TestContext : public chip::Test::AppContext
 {
 public:
  // Performs shared setup for all tests in the test suite
- void SetUpTestSuite() override
+ static void SetUpTestSuite()
  {
  chip::Test::AppContext::SetUpTestSuite();
- mClock.Emplace(chip::System::SystemClock());
+ sClock.Emplace(chip::System::SystemClock());
  }
 
  // Performs shared teardown for all tests in the test suite
- void TearDownTestSuite() override
+ static void TearDownTestSuite()
  {
- mClock.ClearValue();
+ sClock.ClearValue();
  chip::Test::AppContext::TearDownTestSuite();
  }
 
@@ -125,9 +125,11 @@ class TestContext : public chip::Test::AppContext
 
 private:
  chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
- chip::Optional<MockClock> mClock;
+ static chip::Optional<MockClock> sClock;
 };
 
+chip::Optional<MockClock> TestContext::sClock;
+
 void ENFORCE_FORMAT(1, 2) SimpleDumpWriter(const char * aFormat, ...)
 {
  va_list args;
@@ -370,10 +372,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
  "EventLogging",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

src/app/tests/TestEventOverflow.cpp

@@ -169,10 +169,10 @@ nlTestSuite sSuite =
 {
  "TestEventOverflow",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestFabricScopedEventLogging.cpp

@@ -278,10 +278,10 @@ nlTestSuite sSuite =
 {
  "TestFabricScopedEventLogging",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestInteractionModelEngine.cpp

@@ -773,10 +773,10 @@ nlTestSuite sSuite =
 {
  "TestInteractionModelEngine",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestReadInteraction.cpp

@@ -79,13 +79,13 @@ class TestContext : public chip::Test::AppContext
 {
 public:
  // Performs shared setup for all tests in the test suite
- void SetUpTestSuite() override
+ static void SetUpTestSuite()
  {
  chip::Test::AppContext::SetUpTestSuite();
  gRealClock = &chip::System::SystemClock();
  chip::System::Clock::Internal::SetSystemClockForTesting(&gMockClock);
 
- if (mSyncScheduler)
+ if (sSyncScheduler)
  {
  gReportScheduler = chip::app::reporting::GetSynchronizedReportScheduler();
  sUsingSubSync = true;
@@ -96,14 +96,8 @@ class TestContext : public chip::Test::AppContext
  }
  }
 
- static int nlTestSetUpTestSuite_Sync(void * context)
- {
- static_cast<TestContext *>(context)->mSyncScheduler = true;
- return nlTestSetUpTestSuite(context);
- }
-
  // Performs shared teardown for all tests in the test suite
- void TearDownTestSuite() override
+ static void TearDownTestSuite()
  {
  chip::System::Clock::Internal::SetSystemClockForTesting(gRealClock);
  chip::Test::AppContext::TearDownTestSuite();
@@ -133,9 +127,21 @@ class TestContext : public chip::Test::AppContext
  chip::Test::AppContext::TearDown();
  }
 
-private:
+protected:
  chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
- bool mSyncScheduler = false;
+ static bool sSyncScheduler;
+};
+
+bool TestContext::sSyncScheduler = false;
+
+class TestSyncContext : public TestContext
+{
+public:
+ static void SetUpTestSuite()
+ {
+ sSyncScheduler = true;
+ TestContext::SetUpTestSuite();
+ }
 };
 
 class TestEventGenerator : public chip::app::EventLoggingDelegate
@@ -5146,19 +5152,19 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
  "TestReadInteraction",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 nlTestSuite sSyncSuite = {
  "TestSyncReadInteraction",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite_Sync,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestSyncContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestSyncContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestSyncContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestSyncContext, TearDown),
 };
 
 } // namespace

src/app/tests/TestReportScheduler.cpp

@@ -821,10 +821,10 @@ static nlTest sTests[] = {
 nlTestSuite sSuite = {
  "TestReportScheduler",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

src/app/tests/TestReportingEngine.cpp

@@ -350,10 +350,10 @@ nlTestSuite sSuite =
 {
  "TestReportingEngine",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestTimedHandler.cpp

@@ -264,10 +264,10 @@ nlTestSuite sSuite =
 {
  "TestTimedHandler",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

src/app/tests/TestWriteInteraction.cpp

@@ -1063,10 +1063,10 @@ const nlTest sTests[] =
 nlTestSuite sSuite = {
  "TestWriteInteraction",
  &sTests[0],
- TestContext::nlTestSetUpTestSuite,
- TestContext::nlTestTearDownTestSuite,
- TestContext::nlTestSetUp,
- TestContext::nlTestTearDown,
+ NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+ NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+ NL_TEST_WRAP_METHOD(TestContext, SetUp),
+ NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

src/lib/support/UnitTestRegistration.h

@@ -48,6 +48,20 @@
  VerifyOrDie(chip::RegisterUnitTests(&FUNCTION) == CHIP_NO_ERROR); \
  }
 
+// TODO: remove these once transition to pw_unit_test is completed
+#define NL_TEST_WRAP_FUNCTION(FUNCTION) \
+ [](void * _context) -> int { \
+ FUNCTION(); \
+ return SUCCESS; \
+ }
+
+#define NL_TEST_WRAP_METHOD(CLASS, METHOD) \
+ [](void * context) -> int { \
+ auto ctx = static_cast<CLASS *>(context); \
+ ctx->METHOD(); \
+ return SUCCESS; \
+ }
+
 namespace chip {
 
 typedef int (*UnitTestTriggerFunction)();

src/messaging/tests/MessagingContext.cpp

@@ -58,7 +58,7 @@ CHIP_ERROR MessagingContext::Init(TransportMgrBase * transport, IOContext * ioCo
  ReturnErrorOnFailure(mExchangeManager.Init(&mSessionManager));
  ReturnErrorOnFailure(mMessageCounterManager.Init(&mExchangeManager));
 
- if (mInitializeNodes)
+ if (sInitializeNodes)
  {
  ReturnErrorOnFailure(CreateAliceFabric());
  ReturnErrorOnFailure(CreateBobFabric());
@@ -112,6 +112,8 @@ using namespace System::Clock::Literals;
 constexpr chip::System::Clock::Timeout MessagingContext::kResponsiveIdleRetransTimeout;
 constexpr chip::System::Clock::Timeout MessagingContext::kResponsiveActiveRetransTimeout;
 
+bool MessagingContext::sInitializeNodes = true;
+
 void MessagingContext::SetMRPMode(MRPMode mode)
 {
  if (mode == MRPMode::kDefault)
@@ -302,6 +304,10 @@ Messaging::ExchangeContext * MessagingContext::NewExchangeToBob(Messaging::Excha
  return mExchangeManager.NewContext(GetSessionAliceToBob(), delegate, isInitiator);
 }
 
+LoopbackTransportManager LoopbackMessagingContext::sLoopbackTransportManager;
+
+UDPTransportManager UDPMessagingContext::sUDPTransportManager;
+
 void MessageCapturer::OnMessageReceived(const PacketHeader & packetHeader, const PayloadHeader & payloadHeader,
  const SessionHandle & session, DuplicateMessage isDuplicate,
  System::PacketBufferHandle && msgBuf)