Skip to content
New issue

Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.

By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.

Already on GitHub? Sign in to your account

Basic comp tests: Update to Test plan style #28145

Merged
merged 6 commits into from
Jul 22, 2023

Conversation

cecille
Copy link
Contributor

@cecille cecille commented Jul 21, 2023

Also add in the missing bits.

NOTE: Still missing the topology test - it's getting close to the
deadline and I don't want to rush here and make errors.

Also add in the missing bits.

NOTE: Still missing the topology test - it's getting close to the
      deadline and I don't want to rush here and make errors.
@mergify mergify bot merged commit f860991 into project-chip:master Jul 22, 2023
48 checks passed
@cecille cecille deleted the device_basic_comp branch September 28, 2023 14:48
Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment
Projects
None yet
Development

Successfully merging this pull request may close these issues.

3 participants