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"Simplified Partial Discharge Model" for XIPD Experiment (HYOSUNG project)
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The model calculations were included in the discussion section of the following article.
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J. Shin, E. Kim, S. Kim, H. Jo and J. Jung, "Characteristics of partial discharge induced by continuous X-ray exposure of void defects in insulator," in IEEE Transactions on Dielectrics and Electrical Insulation, vol. 26, no. 5, pp. 1441-1447, Oct. 2019, https://ieeexplore.ieee.org/document/8858110.
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