Added conconcurrent testing

TESTS/concurrent/Comms/Comms.cpp

@@ -0,0 +1,217 @@
+/*
+ * Copyright (c) 2016 ARM Limited
+ *
+ * Licensed under the Apache License, Version 2.0 (the "License");
+ * you may not use this file except in compliance with the License.
+ * You may obtain a copy of the License at
+ *
+ * http://www.apache.org/licenses/LICENSE-2.0
+ *
+ * Unless required by applicable law or agreed to in writing, software
+ * distributed under the License is distributed on an "AS IS" BASIS,
+ * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ * See the License for the specific language governing permissions and
+ * limitations under the License.
+ */
+
+
+#if !DEVICE_SPI // check if SPI is supported on this device
+ #error [NOT_SUPPORTED] SPI is not supported on this platform, add 'DEVICE_SPI' definition to your platform.
+
+#elif !DEVICE_I2C // check if I2C is supported on this device
+ #error [NOT_SUPPORTED] I2C not supported on this platform, add 'DEVICE_I2C' definition to your platform.
+
+#endif // !DEVICE_SPI or !DEVICE_I2C
+
+
+#include "mbed.h"
+#include "greentea-client/test_env.h"
+#include "unity.h"
+#include "utest.h"
+#include "ci_test_config.h"
+#include "FATFileSystem.h"
+#include "SDBlockDevice.h"
+#include <I2CEeprom.h>
+
+using namespace utest::v1;
+
+#define TEST_STRING_MAX 128
+
+Thread Thread_I2C; // thread used in multithread tests
+Thread Thread_SPI; // thread used in multithread tests
+osThreadId Multi_Thread_ID; // thread id for main function controlling multithread tests
+char Test_String[TEST_STRING_MAX] = {0}; // reference string used in testing
+
+// Fill array with random characters. TODO: make this string a randomly generated thing
+void init_string()
+{
+ for(int x = 0; x < TEST_STRING_MAX-1; x++){
+ Test_String[x] = 'A' + (rand() % 26);
+ }
+ Test_String[TEST_STRING_MAX-1] = 0;
+
+ DEBUG_PRINTF("\r\n****\r\n Test_String Size(Bytes) = %d\r\n Test_String = %s\r\n****\r\n",TEST_STRING_MAX,Test_String);
+}
+
+
+// test I2C API by writting and reading from EEPROM
+void test_I2C()
+{
+ // initialize variables and API
+ int address = 0; // starting address to write to
+ int num_read = 0; // will report number of bytes read
+ int num_written = 0; // will report number of bytes written
+ volatile char read_string[TEST_STRING_MAX] = {0}; // string that will be updated from reading EEPROM
+ I2CEeprom memory(MBED_CONF_APP_I2C_SDA,MBED_CONF_APP_I2C_SCL,MBED_CONF_APP_I2C_EEPROM_ADDR,32,0);
+
+ // write to EEPROM
+ num_written = memory.write(address,Test_String,TEST_STRING_MAX);
+
+ // read back from EEPROM
+ num_read = memory.read(address,(char *)read_string,TEST_STRING_MAX);
+
+ // test for equality
+ TEST_ASSERT_EQUAL_STRING_MESSAGE(Test_String,(char *)read_string,"String read does not match the string written"); // test that strings match
+ TEST_ASSERT_EQUAL_MESSAGE(num_written,num_read,"Number of bytes written does not match the number of bytes read");
+ DEBUG_PRINTF("\r\n****\r\n I2C TEST:\r\n Address = `%d`\r\n Num Bytes Written = `%d` \r\n Num Bytes Read = `%d` \r\n String written = `%s` \r\n String read = `%s` \r\n****\r\n",address,num_written,num_read,Test_String,read_string);
+ osSignalSet(Multi_Thread_ID, 0x1); // signal completion of thread
+}
+
+
+// test SPI API by writing and reading from SD card
+void test_SPI()
+{
+ // initialze SD hardware, filesystem, and variables
+ SDBlockDevice sd(MBED_CONF_APP_SPI_MOSI, MBED_CONF_APP_SPI_MISO, MBED_CONF_APP_SPI_CLK, MBED_CONF_APP_SPI_CS);
+ FATFileSystem fs("sd", &sd);
+ sd.init();
+ fs.mount(&sd);
+ FILE *File = fopen("/sd/test_sd_w.txt", "w");
+ TEST_ASSERT_MESSAGE(File != NULL,"SD Card is not present. Please insert an SD Card.");
+ volatile char read_string[TEST_STRING_MAX] = {0};
+
+ // write data to SD card
+ int error = fprintf(File, Test_String); // write data
+ TEST_ASSERT_MESSAGE(error > 0,"Writing file to sd card failed"); // error checking 
+ fclose(File); // close file on SD
+
+ // read data from SD card
+ File = fopen("/sd/test_sd_w.txt", "r");
+ fgets((char *)read_string,TEST_STRING_MAX,File); // read string from the file
+
+ // test for equality
+ TEST_ASSERT_EQUAL_STRING_MESSAGE(Test_String,(char *)read_string,"String read does not match the string written"); // test that strings match
+ DEBUG_PRINTF("\r\n****\r\n SPI TEST:\r\n String written = `%s` \r\n String read = `%s` \r\n****\r\n",Test_String,read_string);
+
+ // close, unmount, and deinitialize
+ fclose(File); // close file on SD
+ fs.unmount();
+ sd.deinit();
+ osSignalSet(Multi_Thread_ID, 0x2); // signal completion of thread
+}
+
+
+// test I2C and SPI APIs concurrently in multiple threads
+void test_multiple_threads()
+{
+ Multi_Thread_ID = Thread::gettid(); // update thread id for this thread
+ Thread_I2C.start(callback(test_I2C)); // kick off threads
+ Thread_SPI.start(callback(test_SPI)); // kick off threads
+ wait(0.1); // allow time for debug print statements to complete.
+
+ // Use this to wait for both signaling events to occur
+ // Internaly the code is doing something like this:
+ // if ((signal1 | signal2) & 0x3 == 0x3) then exit, else wait
+ osSignalWait(0x3, osWaitForever);
+}
+
+
+// test I2C and SPI APIs concurrently in a single thread
+void test_single_thread()
+{
+ // *******************************
+ // Initialize variables and APIs
+ // *******************************
+
+ // I2C test initializations
+ int address = 0; // starting address to write to in EEPROM
+ int num_read = 0; // will report number of bytes read
+ int num_written = 0; // will report number of bytes written
+ volatile char read_string_i2c[TEST_STRING_MAX] = {0}; // string that will be updated from reading EEPROM
+ I2CEeprom memory(MBED_CONF_APP_I2C_SDA,MBED_CONF_APP_I2C_SCL,MBED_CONF_APP_I2C_EEPROM_ADDR,32,0);
+
+ // SPI test initializations
+ volatile char read_string_spi[TEST_STRING_MAX] = {0}; // string that will be updated from reading SD card
+ SDBlockDevice sd(MBED_CONF_APP_SPI_MOSI, MBED_CONF_APP_SPI_MISO, MBED_CONF_APP_SPI_CLK, MBED_CONF_APP_SPI_CS);
+ FATFileSystem fs("sd", &sd);
+ sd.init();
+ fs.mount(&sd);
+ FILE *File = fopen("/sd/test_sd_w.txt", "w");
+ TEST_ASSERT_MESSAGE(File != NULL,"SD Card is not present. Please insert an SD Card.");
+
+ // ******************************
+ // Begin concurrent API testing
+ // ******************************
+ // write to EEPROM using I2C
+ num_written = memory.write(address,Test_String,TEST_STRING_MAX);
+
+ // write to SD card using SPI
+ int error = fprintf(File, Test_String); // write data
+ TEST_ASSERT_MESSAGE(error > 0,"Writing file to sd card failed"); // error checking 
+ fclose(File); // close file on SD
+
+ // read back from EEPROM
+ num_read = memory.read(address,(char *)read_string_i2c,TEST_STRING_MAX);
+
+ // read data from SD card
+ File = fopen("/sd/test_sd_w.txt", "r"); 
+ fgets((char *)read_string_spi,TEST_STRING_MAX,File); // read string from the file
+
+ // ******************************
+ // Check results
+ // ******************************
+
+ // test results for I2C
+ TEST_ASSERT_EQUAL_STRING_MESSAGE(Test_String,(char *)read_string_i2c,"String read does not match the string written"); // test that strings match
+ TEST_ASSERT_EQUAL_MESSAGE(num_written,num_read,"Number of bytes written does not match the number of bytes read");
+ DEBUG_PRINTF("\r\n****\r\n I2C TEST:\r\n Address = `%d`\r\n Num Bytes Written = `%d` \r\n Num Bytes Read = `%d` \r\n String written = `%s` \r\n String read = `%s` \r\n****\r\n",address,num_written,num_read,Test_String,read_string_i2c);
+
+ // test results for SPI
+ TEST_ASSERT_EQUAL_STRING_MESSAGE(Test_String,(char *)read_string_spi,"String read does not match the string written"); // test that strings match
+ DEBUG_PRINTF("\r\n****\r\n SPI TEST:\r\n String written = `%s` \r\n String read = `%s` \r\n****\r\n",Test_String,read_string_spi);
+ fclose(File); // close file on SD 
+ fs.unmount(); // unmount
+ sd.deinit(); // deinitialize SD
+}
+
+
+utest::v1::status_t test_setup(const size_t number_of_cases)
+{
+ // Setup Greentea using a reasonable timeout in seconds
+ GREENTEA_SETUP(40, "default_auto");
+ return verbose_test_setup_handler(number_of_cases);
+}
+
+
+// Handle test failures, keep testing, dont stop
+utest::v1::status_t greentea_failure_handler(const Case *const source, const failure_t reason)
+{
+ greentea_case_failure_abort_handler(source, reason);
+ return STATUS_CONTINUE;
+}
+
+
+// Test cases
+Case cases[] = {
+ Case("Concurrent testing of I2C and SPI in a single thread",test_single_thread,greentea_failure_handler),
+ Case("Concurrent testing of I2C and SPI in multiple threads",test_multiple_threads,greentea_failure_handler),
+};
+
+
+Specification specification(test_setup, cases);
+
+// // Entry point into the tests
+int main() {
+ init_string();
+ return !Harness::run(specification);
+}

TESTS/concurrent/GPIO/GPIO.cpp

@@ -0,0 +1,140 @@
+/*
+ * Copyright (c) 2016 ARM Limited
+ *
+ * Licensed under the Apache License, Version 2.0 (the "License");
+ * you may not use this file except in compliance with the License.
+ * You may obtain a copy of the License at
+ *
+ * http://www.apache.org/licenses/LICENSE-2.0
+ *
+ * Unless required by applicable law or agreed to in writing, software
+ * distributed under the License is distributed on an "AS IS" BASIS,
+ * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ * See the License for the specific language governing permissions and
+ * limitations under the License.
+ */
+
+#include "mbed.h"
+#include "greentea-client/test_env.h"
+#include "unity.h"
+#include "utest.h"
+#include "ci_test_config.h"
+
+using namespace utest::v1;
+
+volatile bool Result = false;
+
+// Callback for all InterruptInput functions
+void cbfn(void)
+{
+ Result = true;
+}
+
+
+// Template to test DigitalIO, AnalogIn, and InterruptIn pins. Meant to be re-used multiple times
+template <PinName digitalOut_pin, PinName digitalIn_pin, PinName analogIn_pin, PinName analogBus_pin1, PinName analogBus_pin2, PinName analogBus_pin3, PinName analogBus_pin4, PinName analogBus_pin5, PinName interruptIn_pin, PinName interruptOut_pin> 
+
+
+void GPIO_Test()
+{
+ // ***********************
+ // Initialize API pins
+ // ***********************
+ DEBUG_PRINTF("Initializing API pins\n");
+ // Pins for DIO test
+ DigitalOut d_out(digitalOut_pin);
+ DigitalIn d_in(digitalIn_pin);
+
+ // Pins for AnalogIn test
+ AnalogIn a_in(analogIn_pin);
+ BusInOut aBus_outputs(analogBus_pin1,analogBus_pin2,analogBus_pin3,analogBus_pin4,analogBus_pin5);
+
+ // Pins for InterruptIn test
+ InterruptIn int_in(interruptIn_pin);
+ DigitalOut int_out(interruptOut_pin);
+
+ // ***********************
+ // Begin concurrent API testing
+ // ***********************
+ DEBUG_PRINTF("Begining concurrent API testing\n");
+ aBus_outputs.output();
+ int analogOut_value= 0;
+ aBus_outputs = 0;
+ float prev_analog_value = 0;
+ for(int iter = 0; iter<5; iter++) { 
+ // DigitalIO test
+ d_out = 0; // test 0
+ TEST_ASSERT_MESSAGE(0 == d_in.read(),"Expected value to be 0, read value was not zero");
+ d_out = 1; // test 1
+ TEST_ASSERT_MESSAGE(1 == d_in.read(),"Expected value to be 1, read value was not one");
+
+ // AnalogIn test
+ prev_analog_value = a_in.read();
+ analogOut_value = (analogOut_value << 1) + 1;
+ aBus_outputs = analogOut_value;
+ TEST_ASSERT_MESSAGE(a_in.read() > prev_analog_value,"Analog Input did not increment.");
+
+ // Rising Edge InterruptIn test
+ Result = false;
+ int_out = 0;
+ int_in.rise(cbfn);
+ int_out = 1;
+ wait(0); // dummy wait to get volatile result value
+ TEST_ASSERT_MESSAGE(Result,"cbfn was not triggered on rising edge of pin");
+
+ // Falling Edge InterruptIn test
+ Result = false;
+ int_out = 1;
+ int_in.fall(cbfn);
+ int_out = 0;
+ wait(0); // dummy wait to get volatile result value
+ TEST_ASSERT_MESSAGE(Result,"cbfn was not triggered on falling edge of pin");
+ }
+}
+
+
+utest::v1::status_t test_setup(const size_t number_of_cases)
+{
+ // Setup Greentea using a reasonable timeout in seconds
+ GREENTEA_SETUP(30, "default_auto");
+ return verbose_test_setup_handler(number_of_cases);
+}
+
+
+// Handle test failures, keep testing, dont stop
+utest::v1::status_t greentea_failure_handler(const Case *const source, const failure_t reason)
+{
+ greentea_case_failure_abort_handler(source, reason);
+ return STATUS_CONTINUE;
+}
+
+
+// Test cases
+// Runs three different APIs concurrently, DIO, AnalogIn, and InterruptIn
+Case cases[] = {
+ Case("Concurrent testing of DIO(D2,D3), AnalogIn(A0), and InterruptIn(D4,D5)",GPIO_Test<MBED_CONF_APP_DIO_2,MBED_CONF_APP_DIO_3,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_AIN_5,MBED_CONF_APP_DIO_4,MBED_CONF_APP_DIO_5>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D3,D2), AnalogIn(A1), and InterruptIn(D5,D4)",GPIO_Test<MBED_CONF_APP_DIO_3,MBED_CONF_APP_DIO_2, MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_DIO_5,MBED_CONF_APP_DIO_4>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D4,D5), AnalogIn(A2), and InterruptIn(D6,D7)",GPIO_Test<MBED_CONF_APP_DIO_4,MBED_CONF_APP_DIO_5, MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_DIO_6,MBED_CONF_APP_DIO_7>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D5,D4), AnalogIn(A3), and InterruptIn(D7,D6)",GPIO_Test<MBED_CONF_APP_DIO_5,MBED_CONF_APP_DIO_4, MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_DIO_7,MBED_CONF_APP_DIO_6>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D6,D7), AnalogIn(A4), and InterruptIn(D8,D9)",GPIO_Test<MBED_CONF_APP_DIO_6,MBED_CONF_APP_DIO_7, MBED_CONF_APP_AIN_4,MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_DIO_8,MBED_CONF_APP_DIO_9>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D7,D6), AnalogIn(A5), and InterruptIn(D9,D8)",GPIO_Test<MBED_CONF_APP_DIO_7,MBED_CONF_APP_DIO_6, MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_DIO_9,MBED_CONF_APP_DIO_8>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D8,D9), AnalogIn(A5), and InterruptIn(D2,D3)",GPIO_Test<MBED_CONF_APP_DIO_8,MBED_CONF_APP_DIO_9, MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_DIO_2,MBED_CONF_APP_DIO_3>,greentea_failure_handler),
+
+ Case("Concurrent testing of DIO(D9,D8), AnalogIn(A5), and InterruptIn(D3,D2)",GPIO_Test<MBED_CONF_APP_DIO_9,MBED_CONF_APP_DIO_8, MBED_CONF_APP_AIN_5,MBED_CONF_APP_AIN_0,MBED_CONF_APP_AIN_1,MBED_CONF_APP_AIN_2,MBED_CONF_APP_AIN_3,MBED_CONF_APP_AIN_4,MBED_CONF_APP_DIO_3,MBED_CONF_APP_DIO_2>,greentea_failure_handler),
+};
+
+
+Specification specification(test_setup, cases);
+
+
+// Entry point into the tests
+int main()
+{
+ return !Harness::run(specification);
+}