Level testing formatting and updates. #66
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added 21 commits
July 14, 2017 12:56
…f level1. Formatted code
…boards that don't have all the PinMaps defined
…al channels on STM boards, as they cause timeout errors when constructed
… on level1 tests.
… null string, since the test was not really determining which of the two functions was failing individually. The remaining test should be sufficient enough to test I2C.
…rduino pins are connected to shield properly. Removed unused code from Level1 DIO test.
… CS pinmap, but rather the DigitalIO pinmap, per response of issue that I raised here: ARMmbed/mbed-os#4894
… the cs pin in the CS pinmap, but rather the DigitalIO pinmap, per response of issue that I raised here: ARMmbed/mbed-os#4894
…ntended 8 (one for each DIO pin that has a pin pair). Debugged issue and found that 2 of the DIO pins mapped to the Arduino Headers were not getting mapped to DigitalIO pins since they are only defined in the UART pinmaps in PeripheralPins.c. To fix this, I added UART pins to DIO pin mappings in TestFramework.cpp.
… occured was not accurate, and not really necessary for the test to begin with, so was removed.
…es not guarantee that UART_RTS and UART_CTS pins are defined in PeripheralPins.c, which will cause compile time errors if they are missing. For example, K22F does not have these pinmaps.
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Formatted Level0, Level1, and TestFramework to follow mbed style guide. Added ifdef guards to enable compiling on boards that do not have all the functionality required for the tests. Fixed a few bugs, and removed unnecessary asserts.