Level testing formatting and updates.

TESTS/Level0/AnalogIn/AnalogIn.cpp

@@ -38,22 +38,27 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-utest::v1::control_t test_level0_analogin(const size_t call_count) {
+
+utest::v1::control_t test_level0_analogin(const size_t call_count) 
+{
  PinMap pin = test_framework.get_increment_pin(TestFramework::AnalogInput);
- DEBUG_PRINTF("Running analog input constructor on pin %d\n", pin.pin);
- TEST_ASSERT_MESSAGE(pin.pin != NC, "Pin is NC");
+ DEBUG_PRINTF("Running analog input constructor on pin %#x\n", pin.pin);
+  TEST_ASSERT_MESSAGE(pin.pin != NC, "Pin is NC");
 
  AnalogIn ain(pin.pin);
 
  return test_framework.reset_iterator(TestFramework::AnalogInput);
 }
 
+
 Case cases[] = {
  Case("Level 0 - Analog Input Constructor", test_level0_analogin, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level0/AnalogOut/AnalogOut.cpp

@@ -37,22 +37,27 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-utest::v1::control_t test_level0_analogout(const size_t call_count) {
+
+utest::v1::control_t test_level0_analogout(const size_t call_count) 
+{
  PinMap pin = test_framework.get_increment_pin(TestFramework::AnalogOutput);
- DEBUG_PRINTF("Running analog output constructor on pin %d\n", pin.pin);
- TEST_ASSERT_MESSAGE(pin.pin != NC, "Pin is NC");
+ DEBUG_PRINTF("Running analog output constructor on pin %#x\n", pin.pin);
+  TEST_ASSERT_MESSAGE(pin.pin != NC, "Pin is NC");
 
  AnalogOut ain(pin.pin);
 
  return test_framework.reset_iterator(TestFramework::AnalogOutput);
 }
 
+
 Case cases[] = {
  Case("Level 0 - Analog Output Constructor", test_level0_analogout, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level0/BusInOut/BusInOut.cpp

@@ -36,7 +36,9 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-utest::v1::control_t test_level0_businout(const size_t call_count) {
+
+utest::v1::control_t test_level0_businout(const size_t call_count) 
+{
  DEBUG_PRINTF("Running bus input/output constructor\n");
 
  std::vector<PinName> pins; // vector of pins that the bus will contain
@@ -45,18 +47,18 @@ utest::v1::control_t test_level0_businout(const size_t call_count) {
  if(TestFramework::check_size(TestFramework::BusIO)) {
  // fetch new pin
  pins.push_back(test_framework.get_increment_pin(TestFramework::BusIO).pin); 
- } 
+  } 
 
- // if no more suitable pins are available, then add No-Connects until bus is full
- else{
+  // if no more suitable pins are available, then add No-Connects until bus is full
+  else {
  pins.push_back((PinName)NC); 
+ }
  }
- }
 
- DEBUG_PRINTF("Pins assigned to bus:\n pin[0] = %d\n pin[1] = %d\n pin[2] = %d\n pin[3] = %d\n pin[4] = %d\n pin[5] = %d\n pin[6] = %d\n pin[7] = %d\n pin[8] = %d\n pin[9] = %d\n pin[10] = %d\n pin[11] = %d\n pin[12] = %d\n pin[13] = %d\n pin[14] = %d\n pin[15] = %d\n",pins[0],pins[1],pins[2],pins[3],pins[4],pins[5],pins[6],pins[7],pins[8],pins[9],pins[10],pins[11],pins[12],pins[13],pins[14],pins[15]);
+  DEBUG_PRINTF("Pins assigned to bus:\n pin[0] = %#x\n pin[1] = %#x\n pin[2] = %#x\n pin[3] = %#x\n pin[4] = %#x\n pin[5] = %#x\n pin[6] = %#x\n pin[7] = %#x\n pin[8] = %#x\n pin[9] = %#x\n pin[10] = %#x\n pin[11] = %#x\n pin[12] = %#x\n pin[13] = %#x\n pin[14] = %#x\n pin[15] = %#x\n",pins[0],pins[1],pins[2],pins[3],pins[4],pins[5],pins[6],pins[7],pins[8],pins[9],pins[10],pins[11],pins[12],pins[13],pins[14],pins[15]);
 
- // construct the bus with assigned pins
- BusInOut bio(pins[0],pins[1],pins[2],pins[3],pins[4],pins[5],pins[6],pins[7],pins[8],pins[9],pins[10],pins[11],pins[12],pins[13],pins[14],pins[15]);
+  // construct the bus with assigned pins
+  BusInOut bio(pins[0],pins[1],pins[2],pins[3],pins[4],pins[5],pins[6],pins[7],pins[8],pins[9],pins[10],pins[11],pins[12],pins[13],pins[14],pins[15]);
 
  return test_framework.reset_iterator(TestFramework::BusIO);
 }
@@ -65,8 +67,9 @@ Case cases[] = {
  Case("Level 0 - Bus Input/Output Constructor", test_level0_businout, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level0/DigitalIO/DigitalIO.cpp

@@ -34,23 +34,28 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-utest::v1::control_t test_level0_digitalio(const size_t call_count) {
+
+utest::v1::control_t test_level0_digitalio(const size_t call_count) 
+{
  PinMap pin = test_framework.get_increment_pin(TestFramework::DigitalIO);
- DEBUG_PRINTF("Running digital io constructor on pin %d\n", pin.pin);
- TEST_ASSERT_MESSAGE(pin.pin != NC, "Pin is NC");
+ DEBUG_PRINTF("Running digital io constructor on pin %#x\n", pin.pin);
+  TEST_ASSERT_MESSAGE(pin.pin != NC, "Pin is NC");
 
  DigitalOut dout(pin.pin);
  DigitalIn din(pin.pin);
 
  return test_framework.reset_iterator(TestFramework::DigitalIO);
 }
 
+
 Case cases[] = {
  Case("Level 0 - DigitalIO Constructor", test_level0_digitalio, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level0/I2C/I2C.cpp

@@ -38,24 +38,31 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-void construct_i2c(PinName sda, PinName scl) {
- DEBUG_PRINTF("Running I2C Constructor on SDA pin %d and SCL pin %d\n", sda, scl);
- TEST_ASSERT_MESSAGE(sda != NC, "SDA Pin is NC");
- TEST_ASSERT_MESSAGE(scl != NC, "SCL Pin is NC");
 
- I2C i2c(sda, scl);
+void construct_i2c(PinName sda, PinName scl) 
+{
+ DEBUG_PRINTF("Running I2C Constructor on SDA pin %#x and SCL pin %#x\n", sda, scl);
+ TEST_ASSERT_MESSAGE(sda != NC, "SDA Pin is NC");
+ TEST_ASSERT_MESSAGE(scl != NC, "SCL Pin is NC");
+
+ I2C i2c(sda, scl);
 }
 
-utest::v1::control_t test_level0_i2c(const size_t call_count) {
+
+utest::v1::control_t test_level0_i2c(const size_t call_count) 
+{
  return TestFramework::run_i2c(&construct_i2c);
 }
 
+
 Case cases[] = {
  Case("Level 0 - I2C Constructor", test_level0_i2c, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level0/Pwm/Pwm.cpp

@@ -38,24 +38,29 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-utest::v1::control_t test_level0_pwm(const size_t call_count) {
+
+utest::v1::control_t test_level0_pwm(const size_t call_count) 
+{
  PinMap pin = test_framework.get_increment_pin(TestFramework::PWM);
- DEBUG_PRINTF("Running pwm constructor on pin %d\n", pin.pin);
- TEST_ASSERT_MESSAGE(pin.pin != NC, "pin is NC");
+ DEBUG_PRINTF("Running PWM constructor on pin %#x\n", pin.pin);
+  TEST_ASSERT_MESSAGE(pin.pin != NC, "pin is NC");
 
  PwmOut pwm(pin.pin);
- pwm.period(1.0f);
- pwm.write(0.5f);
+  pwm.period(1.0f);
+  pwm.write(0.5f);
 
  return test_framework.reset_iterator(TestFramework::PWM);
 }
 
+
 Case cases[] = {
  Case("Level 0 - PWM Constructor", test_level0_pwm, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level0/SPI/SPI.cpp

@@ -38,27 +38,34 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-void construct_spi(PinName pin_clk, PinName pin_miso, PinName pin_mosi, PinName pin_cs) {
- DEBUG_PRINTF("Running SPI constructor on CLK pin %d, MISO pin %d, MOSI pin %d, and CS pin %d\n", pin_clk, pin_miso, pin_mosi, pin_cs);
- TEST_ASSERT_MESSAGE(pin_clk != NC, "SPI CLK pin is NC");
- TEST_ASSERT_MESSAGE(pin_mosi != NC, "SPI MOSI Pin is NC");
- TEST_ASSERT_MESSAGE(pin_miso != NC, "SPI MISO Pin is NC");
- TEST_ASSERT_MESSAGE(pin_cs != NC, "SPI CS Pin is NC");
 
- SPI(pin_mosi, pin_miso, pin_clk);
- DigitalOut cs(pin_cs);
+void construct_spi(PinName pin_clk, PinName pin_miso, PinName pin_mosi, PinName pin_cs) 
+{
+ DEBUG_PRINTF("Running SPI constructor on CLK pin %#x, MISO pin %#x, MOSI pin %#x, and CS pin %#x\n", pin_clk, pin_miso, pin_mosi, pin_cs);
+ TEST_ASSERT_MESSAGE(pin_clk != NC, "SPI CLK pin is NC");
+ TEST_ASSERT_MESSAGE(pin_mosi != NC, "SPI MOSI Pin is NC");
+ TEST_ASSERT_MESSAGE(pin_miso != NC, "SPI MISO Pin is NC");
+ TEST_ASSERT_MESSAGE(pin_cs != NC, "SPI CS Pin is NC");
+
+ SPI(pin_mosi, pin_miso, pin_clk);
+ DigitalOut cs(pin_cs);
 }
 
-utest::v1::control_t test_level0_spi(const size_t call_count) {
+
+utest::v1::control_t test_level0_spi(const size_t call_count) 
+{
  return test_framework.run_spi(&construct_spi);
 }
 
+
 Case cases[] = {
  Case("Level 0 - SPI Constructor", test_level0_spi, TestFramework::greentea_failure_handler),
 };
 
-int main() {
+
+int main() 
+{
  // Formulate a specification and run the tests based on the Case array
  Specification specification(TestFramework::test_setup<60>, cases);
- return !Harness::run(specification);
+  return !Harness::run(specification);
 }

TESTS/Level1/AnalogIn/AnalogIn.cpp

@@ -29,6 +29,8 @@
 #include "TestFramework.hpp"
 #include <vector>
 
+#define BUS_SIZE 5
+
 using namespace utest::v1;
 
 // Static variables for managing the dynamic list of pins
@@ -38,66 +40,69 @@ std::vector<unsigned int> TestFramework::pin_iterators(TS_NC);
 // Initialize a test framework object
 TestFramework test_framework;
 
-void test_analogin_execute(PinName pin, float tolerance, int iterations) {
- DEBUG_PRINTF("Running analog input range test on pin %d\n", pin);
- TEST_ASSERT_MESSAGE(pin != NC, "Pin is NC");
+void test_analogin_execute(PinName pin, float tolerance, int iterations) 
+{
+ DEBUG_PRINTF("Running analog input range test on pin %#x\n", pin);
+ TEST_ASSERT_MESSAGE(pin != NC, "Pin is NC");
 
- // Find all pins on the resistor ladder that are not the current pin
+  // Find all pins on the resistor ladder that are not the current pin
  std::vector<PinName> resistor_ladder_pins = TestFramework::find_resistor_ladder_pins(pin);
- if (resistor_ladder_pins.size() < 5)
- TEST_ASSERT_MESSAGE(false, "Error finding the resistor ladder pins");
+ if (resistor_ladder_pins.size() < BUS_SIZE){
+ TEST_ASSERT_MESSAGE(false, "Error finding the resistor ladder pins");
+ }
 
  // Create a bus with all of these pins
- BusInOut outputs(resistor_ladder_pins[0],resistor_ladder_pins[1],resistor_ladder_pins[2],resistor_ladder_pins[3],resistor_ladder_pins[4]);
+  BusInOut outputs(resistor_ladder_pins[0],resistor_ladder_pins[1],resistor_ladder_pins[2],resistor_ladder_pins[3],resistor_ladder_pins[4]);
  outputs.output();
 
- DEBUG_PRINTF("Creating a resistive ladder bus with the following pins:\n pin[0] = %d\n pin[1] = %d\n pin[2] = %d\n pin[3] = %d\n pin[4] = %d\n", resistor_ladder_pins[0],resistor_ladder_pins[1],resistor_ladder_pins[2],resistor_ladder_pins[3],resistor_ladder_pins[4]);
+  DEBUG_PRINTF("Creating a resistive ladder bus with the following pins:\n pin[0] = %#x\n pin[1] = %#x\n pin[2] = %#x\n pin[3] = %#x\n pin[4] = %#x\n", resistor_ladder_pins[0],resistor_ladder_pins[1],resistor_ladder_pins[2],resistor_ladder_pins[3],resistor_ladder_pins[4]);
 
- // construct designated analogIn pin
+  // construct designated analogIn pin
  AnalogIn ain(pin);
 
- for (unsigned int i=0; i<iterations; i++) {
-
- // Initialization
- int x = 0;
- int y= 0;
- outputs = 0;
- float prev_value = 0;
- float new_value = 0;
- float test_value = 0;
-
- // Iterate through each of the bus pins
- for(x = 0; x<5; x++) {
-
- // Read the previous value, and turn another pin on in the resistor ladder
- prev_value = ain.read();
- y = (y<<1) + 1;
- outputs = y;
-
- // Read the new value to make sure the voltage increased
- new_value = ain.read();
- DEBUG_PRINTF("new_value on bus = %d\n", new_value);
- TEST_ASSERT_MESSAGE(new_value > prev_value,"Analog Input did not increment. Check that you have assigned valid pins in mbed_app.json file")
-
- // Repeat the read multiple times to verify the output is not fluctuating
- for (unsigned int j = 0; j<iterations; j++) {
- test_value = ain.read();
- TEST_ASSERT_MESSAGE(abs(test_value - new_value) < tolerance, "Analog Input fluctuated past the tolerance");
- }
- }
+ for (unsigned int i=0; i<iterations; i++) {
+ // Initialization
+ int x = 0;
+ int y= 0;
+ outputs = 0;
+ float prev_value = 0;
+ float new_value = 0;
+ float test_value = 0;
+
+ // Iterate through each of the bus pins
+ for(x = 0; x<BUS_SIZE; x++) {
+
+ // Read the previous value, and turn another pin on in the resistor ladder
+ prev_value = ain.read();
+ y = (y<<1) + 1;
+ outputs = y;
+
+ // Read the new value to make sure the voltage increased
+ new_value = ain.read();
+ TEST_ASSERT_MESSAGE(new_value > prev_value,"Analog Input did not increment. Check that you have assigned valid pins in mbed_app.json file")
+
+ // Repeat the read multiple times to verify the output is not fluctuating
+ for (unsigned int j = 0; j<iterations; j++) {
+ test_value = ain.read();
+ TEST_ASSERT_MESSAGE(abs(test_value - new_value) < tolerance, "Analog Input fluctuated past the tolerance");
+ }
+ }
  }
 }
 
-utest::v1::control_t test_level1_analogin(const size_t call_count) {
- return TestFramework::test_level1_framework(TestFramework::AnalogInput, TestFramework::CITS_AnalogInput, &test_analogin_execute, 0.05, 10);
+
+utest::v1::control_t test_level1_analogin(const size_t call_count) 
+{
+ return TestFramework::test_level1_framework(TestFramework::AnalogInput, TestFramework::CITS_AnalogInput, &test_analogin_execute, 0.05, 10);
 }
 
 Case cases[] = {
- Case("Level 1 - Analog Input Range test (single pin)", test_level1_analogin, TestFramework::greentea_failure_handler),
+ Case("Level 1 - Analog Input Range test (single pin)", test_level1_analogin, TestFramework::greentea_failure_handler),
 };
 
-int main() {
- // Formulate a specification and run the tests based on the Case array
- Specification specification(TestFramework::test_setup<30>, cases);
- return !Harness::run(specification);
+int main() 
+{
+ // Formulate a specification and run the tests based on the Case array
+ Specification specification(TestFramework::test_setup<30>, cases);
+ return !Harness::run(specification);
 }