[sw/silicon_creator] Use EXPECT_DEATH in unit tests

Fixes #10549 Signed-off-by: Alphan Ulusoy <alphan@google.com>
lowRISC · Feb 11, 2022 · 4907768 · 4907768
1 parent 4810dd7
commit 4907768
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Showing 5 changed files with 20 additions and 21 deletions.
diff --git a/sw/device/silicon_creator/lib/base/sec_mmio_unittest.cc b/sw/device/silicon_creator/lib/base/sec_mmio_unittest.cc
@@ -173,54 +173,53 @@ TEST_F(SecMmioTest, CheckCount) {
  EXPECT_EQ(ctx_->check_count, 2);
 }
 
-// Negative test cases trigger assertions, which are caugth by `ASSERT_DEATH`
-// calls. All test cases use lambda functions to wrap expectations and work
-// around issue google/googletest#1004.
+// Negative test cases trigger assertions, which are caugth by `EXPECT_DEATH`
+// calls.
 class SecMmioDeathTest : public SecMmioTest {};
 
 TEST_F(SecMmioDeathTest, Read32OrDieSimulatedFault) {
- ASSERT_DEATH(
- [] {
+ EXPECT_DEATH(
+ {
  EXPECT_ABS_READ32(0, 0x12345678);
  EXPECT_ABS_READ32(0, 0);
  sec_mmio_read32(0);
- }(),
+ },
  "");
 }
 
 TEST_F(SecMmioDeathTest, Write32SimulatedFault) {
- ASSERT_DEATH(
- [] {
+ EXPECT_DEATH(
+ {
  EXPECT_ABS_WRITE32(0, 0x12345678);
  EXPECT_ABS_READ32(0, 0);
  sec_mmio_write32(0, 0x12345678);
- }(),
+ },
  "");
 }
 
 TEST_F(SecMmioDeathTest, CheckValuesSimulatedFault) {
- ASSERT_DEATH(
- [] {
+ EXPECT_DEATH(
+ {
  EXPECT_ABS_WRITE32(0, 0x12345678);
  EXPECT_ABS_READ32(0, 0x12345678);
  sec_mmio_write32(0, 0x12345678);
 
  EXPECT_ABS_READ32(0, 0);
  sec_mmio_check_values(/*rnd_offset=*/0);
- }(),
+ },
  "");
 }
 
 TEST_F(SecMmioDeathTest, CheckCountWriteMismatch) {
  // The developer forgot to increment the write counter, or an attacker
  // glitched the sec write operation.
- ASSERT_DEATH(
- [] {
+ EXPECT_DEATH(
+ {
  EXPECT_ABS_WRITE32(0, 0x12345678);
  EXPECT_ABS_READ32(0, 0x12345678);
  sec_mmio_write32(0, 0x12345678);
  sec_mmio_check_counters(/*expected_check_count=*/0);
- }(),
+ },
  "");
 }
 

diff --git a/sw/device/silicon_creator/lib/drivers/lifecycle_unittest.cc b/sw/device/silicon_creator/lib/drivers/lifecycle_unittest.cc
@@ -124,7 +124,7 @@ class LifecycleDeathTest : public LifecycleTest,
  public testing::WithParamInterface<uint32_t> {};
 
 TEST_P(LifecycleDeathTest, InvalidState) {
- ASSERT_DEATH(
+ EXPECT_DEATH(
  {
  EXPECT_SEC_READ32(base_ + LC_CTRL_LC_STATE_REG_OFFSET, GetParam());
  lifecycle_state_get();

diff --git a/sw/device/silicon_creator/lib/shutdown_unittest.cc b/sw/device/silicon_creator/lib/shutdown_unittest.cc
@@ -560,7 +560,7 @@ TEST_F(ShutdownTest, InitializeManufacturing) {
 class ShutdownDeathTest : public ShutdownTest {};
 
 TEST_F(ShutdownDeathTest, InitializeInvalid) {
- ASSERT_DEATH(
+ EXPECT_DEATH(
  {
  SetupOtpReads();
  shutdown_init(static_cast<lifecycle_state_t>(0));

diff --git a/sw/device/silicon_creator/lib/sigverify_unittest.cc b/sw/device/silicon_creator/lib/sigverify_unittest.cc
@@ -170,7 +170,7 @@ INSTANTIATE_TEST_SUITE_P(NonTestOperationalStates, SigverifyInNonTestStates,
 class SigverifyInNonTestStatesDeathTest : public SigverifyInLcState {};
 
 TEST_P(SigverifyInNonTestStatesDeathTest, BadOtpValue) {
- ASSERT_DEATH(
+ EXPECT_DEATH(
  {
  EXPECT_CALL(
  otp_,
@@ -222,7 +222,7 @@ TEST_F(SigverifyInTestStates, BadSignatureIbex) {
 class SigverifyBadLcStateDeathTest : public SigverifyInLcState {};
 
 TEST_F(SigverifyBadLcStateDeathTest, BadLcState) {
- ASSERT_DEATH(
+ EXPECT_DEATH(
  {
  uint32_t flash_exec = 0;
  sigverify_rsa_verify(&kSignature, &key_, &kTestDigest,

diff --git a/sw/device/silicon_creator/mask_rom/sigverify_keys_unittest.cc b/sw/device/silicon_creator/mask_rom/sigverify_keys_unittest.cc
@@ -180,7 +180,7 @@ TEST_P(BadKeyIdTypeDeathTest, BadKeyType) {
  };
  const sigverify_rsa_key_t *key;
 
- ASSERT_DEATH(
+ EXPECT_DEATH(
  {
  ExpectKeysPtrGet(keys);
  sigverify_rsa_key_get(key_id, GetParam(), &key);
@@ -206,7 +206,7 @@ TEST_P(NonOperationalStateDeathTest, BadKey) {
  std::tie(key_index, lc_state) = GetParam();
  const sigverify_rsa_key_t *key;
 
- ASSERT_DEATH(
+ EXPECT_DEATH(
  {
  ExpectKeysPtrGet(kMockKeys);
  sigverify_rsa_key_get(